Publications

This is our catalog of recent publications authored by IBM researchers, in collaboration with the global research community. We’re currently adding our back catalog of more than 110,000 publications. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

Featured collections

Popular topics

Year

15 results for Abhisek Dixit

Evaluation of 10-nm Bulk FinFET RF Performance - Conventional Versus NC-FinFET
- - R. Singh
  - K. Aditya
  - et al.
- 2018
- IEEE Electron Device Letters
Impact of LER on Mismatch in Nanosheet Transistors for 5nm-CMOS
- - Chandan Kumar Jha
  - Charu Gupta
  - et al.
- 2020
- EDTM 2020
Impact of Hot Carrier Stress on RF FOMs in 10-nm Bulk N-Channel FinFETs
- - Anshul Gupta
  - Charu Gupta
  - et al.
- 2019
- IIRW 2019
Comparison of heat outflow in dense sub-14nm contemporary NFETs: Bulk/SOI, inserted-oxide FinFET and nanowire FET
- - Ishita Jain
  - Anshul Gupta
  - et al.
- 2016
- ICEE 2016
7-nm Nanowire FET process variation modeling using industry standard BSIM-CMG model
- - R. Singh
  - K. Aditya
  - et al.
- 2016
- ICEE 2016
Nanowire FET design for 7-nm SOI-CMOS technology
- - Ishita Jain
  - Anil K. Bansal
  - et al.
- 2015
- S3S 2015
Comparison of LER induced mismatch in NWFET and NSFET for 5-nm CMOS
- - Chandan Kumar Jha
  - Pritam Yogi
  - et al.
- 2020
- IEEE J-EDS
Impact of gamma-ray radiation on DC and RF performance of 10-nm bulk n-channel FinFETs
- - K. Aditya
  - R. Singh
  - et al.
- 2020
- IEEE T-DMR
Impact of hot-carrier degradation on drain-induced barrier lowering in multifin SOI n-Channel FinFETs with self-heating
- - Charu Gupta
  - Anshul Gupta
  - et al.
- 2020
- IEEE T-ED
Reliability Modeling and Analysis of Hot-Carrier Degradation in Multiple-Fin SOI n-Channel FinFETs With Self-Heating
- - Anshul Gupta
  - Charu Gupta
  - et al.
- 2019
- IEEE T-ED