Encapsulated tips for reliable nanoscale conduction in scanning probe technologiesHarish BhaskaranAbu Sebastianet al.2009Nanotechnology
Nanoscale PtSi tips for conducting probe technologiesHarish BhaskaranAbu Sebastianet al.2009IEEE TNANO
Probe-based ultrahigh-density storage technologyAngeliki PantaziAbu Sebastianet al.2008IBM J. Res. Dev
Achieving subnanometer precision in a MEMS-based storage device during self-servo write processAbu SebastianAngeliki Pantaziet al.2008IEEE TNANO
Modeling and experimental identification of silicon microheater dynamics: A systems approachAbu SebastianDorothea Wiesmann2008JMEMS
Control of MEMS-based scanning-probe data-storage devicesAngeliki PantaziAbu Sebastianet al.2007IEEE TCST
A review of the systems approach to the analysis of dynamic-mode atomic force microscopyAbu SebastianAnil Gannepalliet al.2007IEEE TCST
Integrating nanotechnology into a working storage deviceA.W. KnollP. Bächtoldet al.2006Microelectronic Engineering
A robust control based solution to the sample-profile estimation problem in fast atomic force microscopySrinivasa M. SalapakaTathagata Deet al.2005International Journal of Robust and Nonlinear Control