Multiscale thermoelectric imaging for fast metrology and manipulationRachel J. CannaraAbu Sebastianet al.2009NANO 2009
Estimation of amorphous fraction in multilevel phase change memory cellsNikolaos PapandreouA. Pantaziet al.2009ESSDERC 2009
Novel scanning probe concepts for nanoscale electrical characterizationAbu SebastianHarish Bhaskaranet al.2009NANO 2009
High-speed intermittent-contact mode scanning probe microscopy using cantilevers with integrated electrostatic actuator and thermoelectric sensorD.R. SahooW. Häberleet al.2009ACC 2009
Nanoscale phase transformation in Ge2 Sb2 Te 5 using encapsulated scanning probes and retraction force microscopyHarish BhaskaranAbu Sebastianet al.2009Review of Scientific Instruments
Signal transformation approach to fast nanopositioningAbu SebastianS. O. Reza Moheimani2009Review of Scientific Instruments
Design of power-optimized thermal cantilevers for scanning probe topography sensingH. RothuizenM. Despontet al.2009MEMS 2009
Encapsulated tips for reliable nanoscale conduction in scanning probe technologiesHarish BhaskaranAbu Sebastianet al.2009Nanotechnology
Nanoscale PtSi tips for conducting probe technologiesHarish BhaskaranAbu Sebastianet al.2009IEEE TNANO