Novel scanning probe concepts for nanoscale electrical characterizationAbu SebastianHarish Bhaskaranet al.2009NANO 2009
Estimation of amorphous fraction in multilevel phase change memory cellsNikolaos PapandreouA. Pantaziet al.2009ESSDERC 2009
High-speed intermittent-contact mode scanning probe microscopy using cantilevers with integrated electrostatic actuator and thermoelectric sensorD.R. SahooW. Häberleet al.2009ACC 2009
Design of power-optimized thermal cantilevers for scanning probe topography sensingH. RothuizenM. Despontet al.2009MEMS 2009
Modeling and identification of the dynamics of electrostatically actuated Microcantilever with integrated thermal sensorPranav AgarwalDeepak Sahooet al.2008CDC 2008
On intermittent-contact mode sensing using electrostatically-actuated micro-cantilevers with integrated thermal sensorsD.R. SahooW. Häberleet al.2008ACC 2008
Jitter investigation and performance evaluation of a small-scale probe storage device prototypeAbu SebastianAngeliki Pantaziet al.2007GLOBECOM 2007
Towards faster data access: Seek operations in MEMS-based storage devicesA. SebastianA. Pantaziet al.2006CCA 2006
Scanning probes entering data storage: From promise to realityH. PozidisP. Bächtoldet al.2006INEC 2006
Dynamics of silicon micro-heaters: Modelling and experimental identificationDorothea WiesmannAbu Sebastian2006MEMS 2006