Electron Beam Probing - A Solution for MCM Test and Failure Analysis
- R. Schmid
- R. Schmitt
- et al.
- 1997
- Journal of Electronic Testing: Theory and Applications (JETTA)
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3 results for M. Brunner
Simulation of backscattered electrons by reflection of primary electrons applied to optimization of detector designs
- M. Brunner
- 1983
- Applied Physics Letters
Schlieren method as applied to magnetic recording heads in the scanning electron microscope
- Oliver C. Wells
- Matthias Brunner
- 1983
- Applied Physics Letters