Surendra B. Anantharaman, Joachim Kohlbrecher, et al.
MRS Fall Meeting 2020
The critical current density of single-, bi-, and polycrystalline Y1Ba2Cu3O7 films has been imaged by low Temperature Scanning Electron Microscopy (LTSEM) with a spatial resolution of 1/μ. Our experiments directly show that grain boundaries limit the critical current density in polycrystalline films. Substantial variatoons of the critical current density have also been found in high quality, c-axis oriented epitaxial films, which have critical current densities above 1×106A/cm2 at 77K. © 1989.
Surendra B. Anantharaman, Joachim Kohlbrecher, et al.
MRS Fall Meeting 2020
Shiyi Chen, Daniel Martínez, et al.
Physics of Fluids
S.F. Fan, W.B. Yun, et al.
Proceedings of SPIE 1989
Robert W. Keyes
Physical Review B