Lawrence Suchow, Norman R. Stemple
JES
The magnetic properties of rf sputtered Ni8Fe,9films were studied as a function of thickness from < 100 to —1200 A. In contrast to some recently reported studies, there was no evidence of an oscillatory dependence of resistivity on Ap as a function of thickness. The magnetoresistance, resistance, coercivity, and anisotropy field varied smoothly with thickness. In contrast, the magnetostriction Ashad a minimum of — 1.5x10“6at —300 A. The saturation magnetic moment did not decrease with thickness over the thickness range studied here. The derived magnetoresistance of an “infinitely” thick film was 3.92% compared to the bulk value of —4%. The analysis indicates that surface and grain-boundary scattering are the primary cause of lower than bulk values of magnetoresistance in these thin permalloy films. © 1991, American Vacuum Society. All rights reserved.
Lawrence Suchow, Norman R. Stemple
JES
R.J. Gambino, N.R. Stemple, et al.
Journal of Physics and Chemistry of Solids
S.F. Fan, W.B. Yun, et al.
Proceedings of SPIE 1989
J. Tersoff
Applied Surface Science