SPIE Advanced Lithography 2014
Conference paper

Rapid, accurate improvement in 3D mask representation via input geometry optimization and crosstalk

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This paper extends the state of the art by demonstrating performance improvements in the Domain Decomposition Method (DDM) from a physical perturbation of the input mask geometry. Results from four testcases demonstrate that small, direct modifications in the input mask stack slope and edge location can result in model calibration and verification accuracy benefit of up to 30%. All final mask optimization results from this approach are shown to be valid within measurement accuracy of the dimensions expected from manufacture. We highlight the benefits of a more accurate description of the 3D EMF near field with crosstalk in model calibration and impact as a function of mask dimensions. The result is a useful technique to align DDM mask model accuracy with physical mask dimensions and scattering via model calibration. © 2014 SPIE.