Lawrence Suchow, Norman R. Stemple
JES
A measurement concept based on a two-port vector network analyzer has been developed, which enables pure-mode on-wafer measurements of differential circuits in the millimeter-wave frequency range. An error model for the measurement system is derived as required for future calibration algorithms. Based on WR15 waveguide components, together with 1.85-mm coaxial probes, a setup has been built and its amplitude and phase imbalances have been characterized in the frequency range from 50 to 65 GHz. © 2005 IEEE.
Lawrence Suchow, Norman R. Stemple
JES
Ellen J. Yoffa, David Adler
Physical Review B
J. Tersoff
Applied Surface Science
Zelek S. Herman, Robert F. Kirchner, et al.
Inorganic Chemistry