Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
A measurement concept based on a two-port vector network analyzer has been developed, which enables pure-mode on-wafer measurements of differential circuits in the millimeter-wave frequency range. An error model for the measurement system is derived as required for future calibration algorithms. Based on WR15 waveguide components, together with 1.85-mm coaxial probes, a setup has been built and its amplitude and phase imbalances have been characterized in the frequency range from 50 to 65 GHz. © 2005 IEEE.
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
O.F. Schirmer, K.W. Blazey, et al.
Physical Review B
S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
E. Burstein
Ferroelectrics