Nickolas J. Mazzeo, Ian L. Sanders, et al.
IEEE Transactions on Magnetics
In this paper, the effect of metal roughness on the total loss, the extracted tan δ, and signal integrity of typical interconnections found in printed-circuit boards is extracted from measurements on three different materials. The differing characteristics of the roughened metal cross sections are highlighted, and a simplified, practical, 2-D, causal, broadband modeling methodology is shown. © 2007 IEEE.
Nickolas J. Mazzeo, Ian L. Sanders, et al.
IEEE Transactions on Magnetics
Alina Deutsch, Gerard V. Kopcsay, et al.
IEEE T-MTT
Alina Deutsch, Howard H. Smith, et al.
IEEE Topical Meeting EPEPS 2003
Alina Deutsch
IEEE Transactions on Advanced Packaging