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Publication
IEEE Topical Meeting EPEPS 2003
Conference paper
Understanding common-mode noise on wide data-buses
Abstract
This paper discusses the effects of the frequency-dependent losses in the reference return path for wide, on-chip data buses, that must be understood in order to accurately predict the interaction and summation of crosstalk and common-mode noise signals. This interaction can generate excessive noise for on-chip global interconnections. Measured and simulated results are shown for representative 8-12 line couplings and circuit-synthesis techniques are shown to capture the correct R(nL(nC behavior ofthe reference series impedance.