NEM switch technologies for low-power logic applications
Daniel Grogg, Yu Pu, et al.
SENSORS 2012
We present an integrated analog front-end (AFE) for the read-channel of a parallel scanning-probe storage device. The read/write element is based on an array of microfabricated silicon cantilevers equipped with heating elements to form nanometer-sized indentations in a polymer surface using integral atomic-force microscope (AFM) tips. An accurate cantilever model based on the combination of a thermal/electrical lumped-element model and a behavioral model of the electrostatic/mechanical part are introduced. The behavioral model of the electrostatic/mechanical part is automatically generated from a full finite-element model (FEM). The model is completely implemented in Verilog-A and was used to co-develop the integrated analog front-end circuitry together with the read/write cantilever. The cantilever model and the analog front-end were simulated together and the results were experimentally verified. The approach chosen is well suited for system-level simulation and verification/extraction in a design environment based on standard EDA tools. © 2007 IEEE.
Daniel Grogg, Yu Pu, et al.
SENSORS 2012
Christoph Hagleitner, Tony Bonaccio, et al.
VLSI Circuits 2006
Burkhard Ringlein, Francois Abel, et al.
EDGE 2023
Markus Graf, Diego Barrettino, et al.
Analytical Chemistry