Jeng-Bang Yau, Jin Cai, et al.
Journal of Applied Physics
A simple method for determining both the emitter and the base series resistances of bipolar transistors from the measured I-V characteristics is described. The method is based on the observation that deviation of the base current from the ideal exp (qVBE/kT) behavior at high currents can be attributed solely and relatively simply to series resistances. Series resistances determined by this method are given for sample high-speed digital bipolar transistors. © 1984 IEEE
Jeng-Bang Yau, Jin Cai, et al.
Journal of Applied Physics
Tak H. Ning
Materials Chemistry and Physics
Jin Cai, Zhibin Ren, et al.
IEEE International SOI Conference 2008
D.D. Tang, Tak H. Ning, et al.
IEEE Journal of Solid-State Circuits