Conference paper
SOI lateral bipolar transistor with drive current >3mA/μm
J. Cai, Tak H. Ning, et al.
S3S 2013
A simple method for determining both the emitter and the base series resistances of bipolar transistors from the measured I-V characteristics is described. The method is based on the observation that deviation of the base current from the ideal exp (qVBE/kT) behavior at high currents can be attributed solely and relatively simply to series resistances. Series resistances determined by this method are given for sample high-speed digital bipolar transistors. © 1984 IEEE
J. Cai, Tak H. Ning, et al.
S3S 2013
Tak H. Ning
ECS Meeting 2007
Pouya Hashemi, Jeng-Bang Yau, et al.
IEEE J-EDS
Tak H. Ning
VLSI-TSA 2003