Publication
Journal of Physics D: Applied Physics
Paper

Measurement of soft X-ray mass absorption coefficients by a thin film technique using proton-induced X-rays

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Abstract

Proton-induced X-rays have been used for the measurement of mass absorption coefficients in the 0.1 to 1 keV energy range. In this technique the absorbing film is supported directly on a substrate which under proton bombardment will generate the characteristic substrate radiation whose absorption in the film will be measured. Results are given for twelve different metals at the B K alpha (184 eV) line.

Date

25 Jan 2001

Publication

Journal of Physics D: Applied Physics

Authors

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