Measurement of soft X-ray mass absorption coefficients by a thin film technique using proton-induced X-rays

Abstract

Proton-induced X-rays have been used for the measurement of mass absorption coefficients in the 0.1 to 1 keV energy range. In this technique the absorbing film is supported directly on a substrate which under proton bombardment will generate the characteristic substrate radiation whose absorption in the film will be measured. Results are given for twelve different metals at the B K alpha (184 eV) line.