Peter J. Price
Surface Science
Epitaxial pseudomorphic films of Cu have been grown on Pt{001} to thicknesses of 1517 layers. A quantitative low-energy electron-diffraction intensity analysis of a ten-layer film reveals that the in-plane lattice constant is that of the Pt{001}1×1 net (a0=3.93), and that the bulk interlayer spacing is 1.620.04. Strain analysis shows that this structure is derived from the fcc structure of Cu with a plane strain of about 9%, similar to Cu films grown on Pd{001}. © 1991 The American Physical Society.
Peter J. Price
Surface Science
E. Babich, J. Paraszczak, et al.
Microelectronic Engineering
Ellen J. Yoffa, David Adler
Physical Review B
T.N. Morgan
Semiconductor Science and Technology