Conference paper
Investigations of silicon nano-crystal floating gate memories
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
Epitaxial pseudomorphic films of Cu have been grown on Pt{001} to thicknesses of 1517 layers. A quantitative low-energy electron-diffraction intensity analysis of a ten-layer film reveals that the in-plane lattice constant is that of the Pt{001}1×1 net (a0=3.93), and that the bulk interlayer spacing is 1.620.04. Strain analysis shows that this structure is derived from the fcc structure of Cu with a plane strain of about 9%, similar to Cu films grown on Pd{001}. © 1991 The American Physical Society.
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
P. Alnot, D.J. Auerbach, et al.
Surface Science
Peter J. Price
Surface Science
Ellen J. Yoffa, David Adler
Physical Review B