PaperSymmetric-Gain, Zero-Offset, Self-Aligned, and Refractory-Contact Double HBT'sSandip Tiwari, Steven L. WrightIEEE Electron Device Letters
Conference paperStatistical measurement of random telegraph noise and its impact in scaled-down high-κ/metal-gate MOSFETsH. Miki, N. Tega, et al.IEDM 2012
Conference paperPower-constrained device and technology design for the end of scalingDavid J. FrankIEDM 2002
Paper1.3 μM Gasb Metal-Semiconductor-Metal PhotodetectorsSandip Tiwari, M. Hargis, et al.IEEE Photonics Technology Letters
