S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
An open-tube process has been used for Zn diffusion in GaAs1-xPx coated with SiO2 films to form p-n junctions. Electroluminescent diodes made by this method have a brightness of 600 ft-L at 5 A/cm2 with no etching of the surface required. The effects of temperature, time, and SiO2 thickness on junction depth, efficiency, and brightness of the diodes are described. © 1972, The Electrochemical Society, Inc. All rights reserved.
S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering
Ming L. Yu
Physical Review B
Thomas H. Baum, Carl E. Larson, et al.
Journal of Organometallic Chemistry