Understanding common-mode noise on wide data-buses
Alina Deutsch, Howard H. Smith, et al.
IEEE Topical Meeting EPEPS 2003
In this paper, the self-consistent, frequency-dependent dielectric constant ε"r(f) and dielectric loss tan δ(f) of several materials are determined over the range 2 to 30 GHz using a short-pulse propagation technique and an iterative extraction based on a rational function expansion. The simple measurement technique is performed in the time domain on representative printed circuit board wiring. Broadband, fully causal transmission-line models based on these results are generated up to 50 GHz for card wiring using low loss materials including BT, Nelco N4000-13, and Nelco N4000-13SI. Simulation and modeling results highlight the need for the accurate frequency-dependent dielectric loss extraction. Signal propagation based on these results shows very good agreement with measured step and pulse time-do-main excitations and provides validation of the measurement and model generation technique. © 2005 IEEE.
Alina Deutsch, Howard H. Smith, et al.
IEEE Topical Meeting EPEPS 2003
Alina Deutsch, Christopher W. Surovic, et al.
IEEE Transactions on Components Packaging and Manufacturing Technology Part B
Warren D. Dyckman, Benjamin Fasano, et al.
DPC 2005
Alina Deutsch, G. Arjavalingam, et al.
IEEE Transactions on Components, Hybrids, and Manufacturing Technology