A. Gangulee, F.M. D'Heurle
Thin Solid Films
Paper
Experimental demonstration of the validity of accelerated radiation damage testing of x-ray mask materials
Related
Fernando Marianno, Wang Zhou, et al.
INFORMS 2021
O.F. Schirmer, K.W. Blazey, et al.
Physical Review B
Paper
The DX centre
T.N. Morgan
Semiconductor Science and Technology