Mark W. Dowley
Solid State Communications
Electric transport properties of sputtered YBa2Cu3O7-δ films were studied as a function of screw dislocation density, ranging from 5·107 cm-2 to 1.3·109 cm-2 as determined at the film surface. A correlation was found between the number of screw dislocations and the critical current density (Jc). Films with higher screw dislocation densities have higher critical current densities and a slower drop of Jc as a function of applied magnetic field H. © 1992 Springer-Verlag.
Mark W. Dowley
Solid State Communications
T.N. Morgan
Semiconductor Science and Technology
J.V. Harzer, B. Hillebrands, et al.
Journal of Magnetism and Magnetic Materials
Dipanjan Gope, Albert E. Ruehli, et al.
IEEE T-MTT