Publication
NATW 2019
Conference paper

Case Study of Advanced Diagnostic Techniques for Multi Port Register File

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Abstract

This paper is a case study of diagnostic techniques used to debug a particularly difficult fail in a multi-port register file memory that appeared to increase its minimum functional voltage (VMIN) over time. Some of the debug techniques used involved Array Built-In-Self Test (ABIST) before and after chips in burn in, CPA (Critical Parameters Analysis), PEM (Photon Emission Microscopy), PICA (Picosecond Image Circuit Analysis) and PFA (Physical Failure Analysis).

Date

01 May 2019

Publication

NATW 2019

Authors

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