About cookies on this site Our websites require some cookies to function properly (required). In addition, other cookies may be used with your consent to analyze site usage, improve the user experience and for advertising. For more information, please review your options. By visiting our website, you agree to our processing of information as described in IBM’sprivacy statement. To provide a smooth navigation, your cookie preferences will be shared across the IBM web domains listed here.
Paper
Capacitance, admittance, and rectification properties of small conductors
Abstract
We formulate microscopic expressions for capacitances, admittances and the rectification properties for small phase-coherent samples consisting of a number of metallic layers separated by insulators. The electric potential in such a structure is discussed with the help of characteristic functions which determine the variation of the microscopic potential inside the sample in response to an increase of the electro-chemical potential at a contact. An electrochemical capacitance matrix is derived which allows for field penetration into the conductor. We discuss the admittance matrix for conductors with nearby capacitors (gates) and analyse its magnetic field symmetry. We use the characteristic potentials to discuss the rectification properties of a conduction channel in the presence of nearby capacitors.