Germanide phase formation and texture
Simon Gaudet, Christian Lavoie, et al.
ISTDM 2006
The high flux and density of X-rays produced at synchrotrons provide the microelectronics industry with a powerful probe of the structure and behavior of a wide array of solid materials that are being developed for use in devices of the future. They also are of great use in determining why currently-used materials and processes sometimes fail. This paper describes the X20 X-ray beamline facility operated by IBM at the National Synchrotron Light Source, and presents a series of three industry challenges and results that illustrate the variety of techniques used and problems addressed. The value of this research ranges from solving short-term, technically specific problems to increasing our academic understanding of materials in general. Techniques discussed include high-resolution diffraction, time-resolved diffraction, texture measurements, and grazing-incidence diffraction. © 2005 Elsevier B.V. All rights reserved.
Simon Gaudet, Christian Lavoie, et al.
ISTDM 2006
Weigang Wang, C. Ni, et al.
Physical Review B - CMMP
Nicolas Breil, A. Carr, et al.
VLSI Technology 2017
Martin M. Frank, Eduard A. Cartier, et al.
EDTM 2022