C.-Y. Wen, M.C. Reuter, et al.
Science
Unusual corrugations observed in scanning-tunneling-microscope (STM) images of 1T-TaS2, Si(111)(2×1), and graphite are explained, and are shown to be characteristic of materials where the Fermi surface has collapsed to a point at the corner of the surface Brillouin zone. This is the first clear case where the low-bias STM image is dominated by electronic structure effects rather than surface geometry. Implications for STM spatial resolution are discussed. © 1986 The American Physical Society.
C.-Y. Wen, M.C. Reuter, et al.
Science
J. Tersoff, P.C. Kelires
Symposium on Process Physics and Modeling in Semiconductor Technology 1990
J. Tersoff
Physical Review Letters
J. Tersoff, B.J. Spencer, et al.
Physical Review Letters