J. Tersoff, N.D. Lang
Physical Review Letters
Unusual corrugations observed in scanning-tunneling-microscope (STM) images of 1T-TaS2, Si(111)(2×1), and graphite are explained, and are shown to be characteristic of materials where the Fermi surface has collapsed to a point at the corner of the surface Brillouin zone. This is the first clear case where the low-bias STM image is dominated by electronic structure effects rather than surface geometry. Implications for STM spatial resolution are discussed. © 1986 The American Physical Society.
J. Tersoff, N.D. Lang
Physical Review Letters
J. Tersoff, P.C. Kelires
Symposium on Process Physics and Modeling in Semiconductor Technology 1990
J. Tersoff
ICDS 1995
J. Tersoff
Surface Science