This paper presents a versatile hardware platform designed for high performance characterization and testing of non-volatile memories. The platform is based on a reconfigurable hardware-software architecture with high degree of multi-domain testing and data acquisition capabilities. The platform constitutes a valuable tool for statistical characterization of the solid-state memory channel for new and emerging non-volatile memories with the goal to study the noise and interference sources that affect the reliability of these devices. We describe the architecture of the hardware testbed and demonstrate its functionality with experimental results from phase-change memory and flash memory devices. © 2013 IEEE.