Mass transport during electromigration in aluminum-magnesium thin filmsA. GanguleeF.M. d'Heurle1975Thin Solid Films
Sources of conduction band polarization in the driving force for electromigrationRolf Landauer1975Thin Solid Films
Grain boundary self-diffusion in evaporated Au films at low temperaturesD. GuptaK.W. Asai1974Thin Solid Films
Evaluation of glancing angle X-ray diffraction and MeV 4He backscattering analyses of silicide formationS.S. LauW.K. Chuet al.1974Thin Solid Films
The correlation between light-induced metallic film voltages and time-dependent temperature gradientsR.J. von GutfeldP. Zory1974Thin Solid Films
Nucleation of small metal particles on ultrathin SiO2 films on SiL. KasprzakR.B. Laibowitzet al.1974Thin Solid Films