Publications

3498 results for Materials Discovery

Relative elemental sensitivity factors in secondary neutral mass spectrometry
- - A. Wucher
  - F. Novak
  - et al.
- 1988
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Oxidation of a cobalt chromium alloy: An x-ray photoemission spectroscopy study
- - David E. Fowler
  - Juergen Rogozik
- 1988
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Optical analysis of thin-layer electrochemical cells for infrared spectroscopy of adsorbates
- - D.S. Bethune
  - A.C. Luntz
  - et al.
- 1988
- Surface Science
Low-energy neutral/ion backscattering at As/Si(001)
- - H. Niehus
  - K. Mann
  - et al.
- 1988
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
X-ray photoemission spectroscopy characterization of silicon surfaces after CF₄/H₂magnetron ion etching: Comparisons to reactive ion etching
- - Gottlieb S. Oehrlein
  - Arthur A. Bright
  - et al.
- 1988
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Growth of epitaxial CaSi2 films on Si(111)
- - J.F. Morar
  - M. Wittmer
- 1988
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
The change in Si-AI bonding with metal coverage at the Si(111)^3 xV3^-AI interface
- - J.S. Nelson
  - Inder P. Batra
  - et al.
- 1988
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Plasma studies on the Leybold-Heraeus INA3 secondary neutral mass spectrometry system
- - A. Wucher
- 1988
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Solvent-induced local deformation zones in polyimide films adhered to a rigid substrate
- - A.C.M. Yang
  - H.R. Brown
- 1988
- Journal of Materials Science
On the effect of Knudsen-layer formation on studies of vaporization, sputtering, and desorption
- - Roger Kelly
  - R.W. Dreyfus
- 1988
- Surface Science