A Layout for the Shuffle-Exchange Network with O(N2/log3/2N) AreaDavid SteinbergMichael Rodeh1981IEEE TC
A Simple Procedure to Generate Optimum Test Patterns for Parity Logic NetworksSe June HongDaniel L. Ostapko1981IEEE TC
Testing for Single Intermittent Failures in Combinational Circuits by Maximizing the Probability of Fault DetectionJacob Savir1980IEEE TC
A Tradeoff Study of Switching Systems in Computer Communication NetworksParviz KermaniLeonard Kleinrock1980IEEE TC