Effect of electron trapping on IGFET characteristics
- T.H. Ning
- C.M. Osburn
- et al.
- 1977
- Journal of Electronic Materials
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An internal calibration technique for pseudobinary systems by auger electron spectroscopy
- R. Hammer
- N.J. Chou
- et al.
- 1976
- Journal of Electronic Materials
Residual stress in silicon nitride films
- E.A. Irene
- 1976
- Journal of Electronic Materials
Room temperature oxidation of lead-indium alloy films
- J.M. Eldridge
- D.W. Dong
- et al.
- 1975
- Journal of Electronic Materials
Electromigration and spatial variations in metallic conductivity
- Rolf Landauer
- 1975
- Journal of Electronic Materials
Polarization echoes in piezoelectric semiconductors
- N.S. Shiren
- R.L. Melcher
- 1975
- Journal of Electronic Materials
Two-electron photo-ionization from deep states in semiconductors
- T.N. Morgan
- 1975
- Journal of Electronic Materials
The use of differential thermal analysis for the examination of glasses
- A. Reisman
- M. Berkenblit
- et al.
- 1975
- Journal of Electronic Materials
Some properties of chemically vapor deposited films of AlxOyNz on silicon
- E.A. Irene
- V.J. Silvestri
- et al.
- 1975
- Journal of Electronic Materials
Chemical vapor deposition of AlxOyNz films
- V.J. Silvestri
- E.A. Irene
- et al.
- 1975
- Journal of Electronic Materials