Vacuum ultraviolet (VUV) surface treatment process for flip chip and 3-D interconnectionsK. SakumaN. Nagaiet al.2009ECTC 2009
Simplified 20-μm pitch vertical interconnection process for 3D chip stackingKatsuyuki SakumaNoriyasu Nagaiet al.2009IEEJ Transactions on Electrical and Electronic Engineering
Characterization of stacked die using die-to-wafer integration for high yield and throughputK. SakumaP. Andryet al.2008ECTC 2008
3D chip-stacking technology with through-silicon vias and low-volume lead free interconnectionsKatsuyuki SakumaPaul S. Andryet al.2008IBM J. Res. Dev
3D chip stacking technology with low-volume lead-free interconnectionsK. SakumaP. Andryet al.2007ECTC 2007
Assembly, characterization, and reworkability of Pb-free ultra-fine pitch C4s for system-on-packageB. DangS.L. Wrightet al.2007ECTC 2007