Publications

This is our catalog of recent publications authored by IBM researchers, in collaboration with the global research community. We’re currently adding our back catalog of more than 110,000 publications. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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70 results for Thomas Morf

A 0.6-1.2 THz monolithic imaging array
- - Dan Corcos
  - Noam Kaminski
  - et al.
- 2015
- IRMMW-THz 2015
A 3.6pJ/b 56Gb/s 4-PAM receiver with 6-Bit TI-SAR ADC and quarter-rate speculative 2-tap DFE in 32 nm CMOS
- - Hazar Yueksel
  - Lukas Kull
  - et al.
- 2015
- ESSCIRC 2015
A 110 mW 6 bit 36 GS/s interleaved SAR ADC for 100 GBE occupying 0.048 mm² in 32 nm SOI CMOS
- - Lukas Kull
  - J. Pliva
  - et al.
- 2014
- A-SSCC 2014
Modeling and optimization method for thermal THz sensing with MOS transistors
- - Dan Corcos
  - Danny Elad
  - et al.
- 2014
- IRMMW-THz 2014
A DDR3/4 memory link TX supporting 24-40 ω, 0.8-1.6 V, 0.8-5.0 Gb/s with slew rate control and thin oxide output stages in 22-nm CMOS SOI
- - Marcel Kossel
  - Christian Menolfi
  - et al.
- 2014
- ESSCIRC 2014
A 16 Gb/s receiver with DC wander compensated rail-to-rail AC coupling and passive linear-equalizer in 22 nm CMOS
- - Pier Andrea Francese
  - Thomas Toifl
  - et al.
- 2014
- ESSCIRC 2014
A 3.5pJ/bit 8-tap-feed-forward 8-tap-decision feedback digital equalizer for 16Gb/s I/Os
- - Thomas Toifl
  - Peter Buchmann
  - et al.
- 2014
- ESSCIRC 2014
A deep trench capacitor based 2:1 and 3:2 reconfigurable on-chip switched capacitor DC-DC converter in 32 nm SOI CMOS
- - Toke M. Andersen
  - Florian Krismer
  - et al.
- 2014
- APEC 2014
Experimental efficiency evaluation of stacked transistor half-bridge topologies in 14 nm cmos technology
- - Pedro André Martins Bezerra
  - Florian Krismer
  - et al.
- 2021
- Electronics (Switzerland)
An 8b 1.0-to-1.25 GS/s Time-Based ADC With Bipolar VTC and Sense Amplifier Latch Interpolated Gated Ring Oscillator TDC
- - A. Serdar Yonar
  - Pier Andrea Francese
  - et al.
- 2023
- IEEE SSC-L