Quick turnaround technique for highlighting defects in thin Si/SiGe bilayers
- S.W. Bedell
- D.K. Sadana
- et al.
- 2004
- Electrochemical and Solid-State Letters
Publications
Date
Featured collections
Popular topics
103 results for Stephen W. Bedell
Surface Segregation of Al of the Bilayers of Pure Cu and Cu-Al Alloy Films
- Pei-I. Wang
- S.P. Murarka
- et al.
- 2001
- JES
Investigation of surface blistering of hydrogen implanted crystals
- Stephen W. Bedell
- William A. Lanford
- 2001
- Journal of Applied Physics