Grazing incidence synchrotron x-ray diffraction method for analyzing thin films
- G. Lim Parrish
- C. Ortiz
- et al.
- 2011
- Journal of Materials Research
Publications
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.
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4 results for M. Hart
Studies of texture in thin films using synchrotron radiation and energy dispersive diffraction
- M. Hart
- W. Parrish
- et al.
- 1987
- Applied Physics Letters
Advantages of synchrotron radiation for polycrystalline diffractometry
- W. Parrish
- M. Hart
- 1987
- Zeitschrift fur Kristallographie - New Crystal Structures
Line-broadening analysis of synchrotron x-ray diffraction data
- T.C. Huang
- M. Hart
- et al.
- 1987
- Journal of Applied Physics