Theo Frot, Willi Volksen, et al.
IITC/MAM 2011
This paper describes a unique, highly flexible cost competitive method to fabricate microelectronic packages that require thin film interconnections. The method involves fabricating thin film metal/polymer structures multi-up on a reusable temporary glass carrier; the thin film stack is transferred later onto product substrates of choice. The final product substrate can be silicon, co-fired alumina or glass-ceramic, aluminum nitride, diamond, or a printed wiring board. Optionally, one can also use the released thin film decal as a ftexible high wireability interconnect by itself, as an interposer, or in applications like wafer level testing for known good die (KGD). The thin film wiring structure can be fabricated multi-up on a standardized form factor carrier (independent of the characteristics of the final product substrate) in a thin film interconnect foundry, thus significantly reducing cost both from the economies of scale and full utilization of the thin film factory for a variety of customer needs. © 1995 IEEE
Theo Frot, Willi Volksen, et al.
IITC/MAM 2011
Qinghuang Lin, Shyng-Tsong Chen, et al.
ICSICT 2010
R.R. Yu, J. Doyle, et al.
VMIC 2005
J.A. Kash, F.E. Doany, et al.
OFC/NFOEC 2006