Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
The ordering in thin films of symmetric diblock copolymers of polystyrene and poly(methyl methacrylate) has been investigated by neutron reflectivity as a function of film thickness and temperature. The order‐disorder transition in the thin films was found to lose its first order character in that the transition occurs in a continuous manner without the correlation length becoming infinite. In addition, a transition from a partially to fully ordered state was observed which was fully reversible. This transition depended in a power law manner on the film thickness and extrapolates to the bulk order‐disorder transition temperature for thick films. Copyright © 1992 Hüthig & Wepf Verlag
Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
J.A. Barker, D. Henderson, et al.
Molecular Physics
A. Gangulee, F.M. D'Heurle
Thin Solid Films
Q.R. Huang, Ho-Cheol Kim, et al.
Macromolecules