C.M. Brown, L. Cristofolini, et al.
Chemistry of Materials
Measurements of thermoelectric power versus temperature of (CH)x doped with various concentrations of AsF5 are reported. These reflect the semiconductor-metal transition at ∼ 1% doping. The "pristine" thermopower is consistent with the conductivity-derived activation energy of 0.35 eV, and a residual defect/impurity carrier concentration of 0.1%. An analysis of the conductivity based on these data indicates that, while the disorder is certainly important, it is not the cause of the transition. © 1980.
C.M. Brown, L. Cristofolini, et al.
Chemistry of Materials
Biancun Xie, Madhavan Swaminathan, et al.
EMC 2011
Robert W. Keyes
Physical Review B
J.A. Barker, D. Henderson, et al.
Molecular Physics