R.D. Murphy, R.O. Watts
Journal of Low Temperature Physics
Measurements of thermoelectric power versus temperature of (CH)x doped with various concentrations of AsF5 are reported. These reflect the semiconductor-metal transition at ∼ 1% doping. The "pristine" thermopower is consistent with the conductivity-derived activation energy of 0.35 eV, and a residual defect/impurity carrier concentration of 0.1%. An analysis of the conductivity based on these data indicates that, while the disorder is certainly important, it is not the cause of the transition. © 1980.
R.D. Murphy, R.O. Watts
Journal of Low Temperature Physics
Xikun Hu, Wenlin Liu, et al.
IEEE J-STARS
D.D. Awschalom, J.-M. Halbout
Journal of Magnetism and Magnetic Materials
Lawrence Suchow, Norman R. Stemple
JES