A. Gangulee, F.M. D'Heurle
Thin Solid Films
The surface potential variations and the surface morphology of annealed (HfO 2) x(SiO 2) 1-x were investigated by noncontact atomic force microscopy (AFM) in ultrahigh vacuum. The study of the films focused on the compositional and structural characteristics of the phase separation alloy films using x-ray mediated techniques and far infrared spectroscopy. Additional modes of data acquisition included contact potential difference (CPD) and differential capacitance. CPD fluctuations were observed to have a local or fine structure component, which for the Hf-rich samples annealed at higher temperatures, correlated with the microstructure.
A. Gangulee, F.M. D'Heurle
Thin Solid Films
Robert W. Keyes
Physical Review B
David B. Mitzi
Journal of Materials Chemistry
Frank R. Libsch, Takatoshi Tsujimura
Active Matrix Liquid Crystal Displays Technology and Applications 1997