About cookies on this site Our websites require some cookies to function properly (required). In addition, other cookies may be used with your consent to analyze site usage, improve the user experience and for advertising. For more information, please review your options. By visiting our website, you agree to our processing of information as described in IBM’sprivacy statement. To provide a smooth navigation, your cookie preferences will be shared across the IBM web domains listed here.
Publication
IEEE Transactions on Components and Packaging Technologies
Paper
Shot noise thermometry for thermal characterization of templated carbon nanotubes
Abstract
A carbon nanotube (CNT) thermometer that operates on the principles of electrical shot noise is reported. Shot noise thermometry is a self-calibrating measurement technique that relates statistical fluctuations in dc current across a device to temperature. A structure consisting of vertical, top, and bottom-contacted single-walled carbon nanotubes in a porous anodic alumina template was fabricated and used to measure shot noise. Frequencies between 60 and 100 kHz were observed to preclude significant influence from 1/f noise, which does not contain thermally relevant information. Because isothermal models do not accurately reproduce the observed noise trends, a self-heating shot noise model has been developed and applied to experimental data to determine the thermal resistance of a CNT device consisting of an array of vertical single-walled CNTs supported in a porous anodic alumina template. The thermal surface resistance at the nanotube-dielectric interface is found to be 1.5 × 108 K/W, which is consistent with measurements by other techniques. © 2006 IEEE.