M.A. Muñoz, G. Grinstein, et al.
Physical Review E - Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics
Paper
Roughening and lower critical dimension in the random-field ising model
Abstract
It is argued on the basis of a new interface model that the lower critical dimension of random-field Ising systems is two, in agreement with simple domain estimates. © 1982 The American Physical Society.
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