Roughening and lower critical dimension in the random-field ising model

G. Grinstein; Shang-Keng Ma

doi:10.1103/PhysRevLett.49.685

Physical Review Letters

Paper

30 Aug 1982

Roughening and lower critical dimension in the random-field ising model

View publication

Abstract

It is argued on the basis of a new interface model that the lower critical dimension of random-field Ising systems is two, in agreement with simple domain estimates. © 1982 The American Physical Society.

Paper

Algebraic correlations in conserving chaotic systems

Ravi Bhagavatula, G. Grinstein, et al.

Physical Review Letters

Paper

Coarse Graining in Micromagnetics

G. Grinstein, R.H. Koch

Physical Review Letters

Paper

Competing interactions in dispersions of superparamagnetic nanoparticles

G.A. Held, G. Grinstein, et al.

Physical Review B - CMMP

Paper

Surface fluctuations and criticality in a class of one-dimensional sandpile models

J. Krug, J.E.S. Socolar, et al.

Physical Review A

View all publications

Abstract

Related

Algebraic correlations in conserving chaotic systems

Coarse Graining in Micromagnetics

Competing interactions in dispersions of superparamagnetic nanoparticles

Surface fluctuations and criticality in a class of one-dimensional sandpile models