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Publication
Applied Physics Letters
Paper
Rapid measurement of static and dynamic surface forces
Abstract
We present a technique for rapid measurement of surface forces using an ac force microscope. Measurement of both the amplitude and relative phase of a cantilever probe allows simultaneous and rapid determination of static and velocity-dependent forces of order nN over nm length scales. Using this technique, we have also demonstrated the high lateral spatial resolution of the force microscope in the measurement of surface forces.