Quiescent-signal analysis: A multiple supply pad /_DDQ method

Abstract

Increasing leakage current makes single-threshold /DDQ testing ineffective for differentiating defective and defect-free chips. Quiescent-signal analysis is a new detection and diagnosis technique that uses /DDQ measurements at multiple chip supply ports, reducing the leakage component in each measurement and significantly improving detection of subtle defects. The authors apply regression and ellipse analysis to data collected from 12 test chips to evaluate the technique. © 2006 IEEE.