About cookies on this site Our websites require some cookies to function properly (required). In addition, other cookies may be used with your consent to analyze site usage, improve the user experience and for advertising. For more information, please review your options. By visiting our website, you agree to our processing of information as described in IBM’sprivacy statement. To provide a smooth navigation, your cookie preferences will be shared across the IBM web domains listed here.
Publication
Journal of Low Temperature Physics
Paper
Noise characteristics of an ideal shunted Josephson junction
Abstract
Detailed computer simulations have been made of the effect of intrinsic noise current on the I-V characteristic and voltage noise spectral density Sv(f) of an ideal Josephson element shunted by a capacitor and resistor. The minimum value of the parameter Βc at which hysteresis appears in the quasistatic I-V characteristic is greater than the noise-free value of ≈1. Moreover, as Βc is increased, a region of large differential resistance Rd appears in the I-V characteristic that is associated with a large increase in SV(0). In this regime the noise current is seen to cause random switching between the superconducting and nonzero voltage states. For all bias conditions, SV(f) > Rd2SI(f) where SI(f) is the spectral density of the intrinsic current noise. A comparison is made between these results and previous calculations. The implications for low-noise superconducting devices are discussed. © 1981 Plenum Publishing Corporation.