True 3-D displays for avionics and mission crewstations
Elizabeth A. Sholler, Frederick M. Meyer, et al.
SPIE AeroSense 1997
We have investigated nickel in silicon samples with a wide range of initial doping concentrations by EPR, DLTS and photo-EPR techniques. Our results show that the two different Ni-centers which were observed previously by EPR, but whose structure could not be interpreted unambiguously, are both associated with Ni in a substitutional position. They are distinguished by their charges and by slightly different displacements from the ideal substitutional site. A model for the Nis+-center is suggested which explains the symmetry of this center.
Elizabeth A. Sholler, Frederick M. Meyer, et al.
SPIE AeroSense 1997
Frank Stem
C R C Critical Reviews in Solid State Sciences
M.A. Lutz, R.M. Feenstra, et al.
Surface Science
F.J. Himpsel, T.A. Jung, et al.
Surface Review and Letters