Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting
Perpendicular medium with an average grain size of 8.2nm with 20nm thickness has been produced by using a-CoCrPt/Ti/NiAl tri-layer structure. The signal-to-noise ratio improves with the addition of a NiAl seed layer. From the TEM image analysis, the introduction of the NiAl seed layer may enhance the separation between the CoCrPt grains. The ultra-small grain size will improve the performance of perpendicular media for future high-density recording applications. © 2001 Elsevier Science B.V. All rights reserved.
Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting
Julian J. Hsieh
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
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MRS Fall Meeting 2020
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Small