W. Zapka, A.C. Tam, et al.
Microelectronic Engineering
Frequency modulation (FM) spectroscopy is demonstrated to be an attractive tool for gain analysis. It offers the three major features: a) potential high sensitivity in absolute gain measurement, b) high spectral resolution allowing the determination of the spectral gain profile, c) high temporal resolution capable of monitoring gain in short-pulsed systems. As an example, results of a gain analysis of the 6328 å line in a He-Ne discharge are presented. © 1982.
W. Zapka, A.C. Tam, et al.
Microelectronic Engineering
W. Lenth, J.-C. Baumert, et al.
Proceedings of SPIE 1989
W.P. Risk, J.-C. Baumert, et al.
CLEO 1987
A.C. Tam, W. Zapka, et al.
SPIE Microelectronic Processing Integration 1991