W. Zapka, Winfrid Ziemlich, et al.
Microelectronic Engineering
Frequency modulation (FM) spectroscopy is demonstrated to be an attractive tool for gain analysis. It offers the three major features: a) potential high sensitivity in absolute gain measurement, b) high spectral resolution allowing the determination of the spectral gain profile, c) high temporal resolution capable of monitoring gain in short-pulsed systems. As an example, results of a gain analysis of the 6328 å line in a He-Ne discharge are presented. © 1982.
W. Zapka, Winfrid Ziemlich, et al.
Microelectronic Engineering
C. Ortiz, C.N. Afonso, et al.
Applied Physics B Photophysics and Laser Chemistry
P. Pokrowsky, E.A. Whittaker, et al.
Optics Communications
R.D. Miller, J.-C. Baumert, et al.
ACS Division of Polymer Chemistry Washington DC Meeting 1990