R. Ghez, J.S. Lew
Journal of Crystal Growth
The penetration depth of a magnetic field into a superconducting YBa2Cu3O7-x film was measured by polarized neutron reflection. The sample comprised an epitaxial film with the c-axis of its orthorhombic structure perpendicular to the film's surface. Measurements at 14 K showed that a magnetic field (parallel to the surface) penetrates into the surface over a depth of 1400 Å. © 1989.
R. Ghez, J.S. Lew
Journal of Crystal Growth
Frank R. Libsch, Takatoshi Tsujimura
Active Matrix Liquid Crystal Displays Technology and Applications 1997
A.B. McLean, R.H. Williams
Journal of Physics C: Solid State Physics
T.N. Morgan
Semiconductor Science and Technology