Hiroshi Ito, Reinhold Schwalm
JES
NiMnSb thin films have been etched in plasma chemistries ICl and IBr, under inductively coupled plasma conditions. These interhalogens produce practical etch rates (500-1500 Å/min-1) provided the incident ion energy is above threshold values (∼120 eV for ICl, ∼230eV for IBr) and there is a balance of etch product formation and desorption through control of the ion and reactive neutral fluxes. Both chemistries appear promising for pattern transfer in NiMnSb-based spin polarized magnetic devices. © 1999 The Electrochemical Society. All rights reserved.
Hiroshi Ito, Reinhold Schwalm
JES
P. Martensson, R.M. Feenstra
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
A. Krol, C.J. Sher, et al.
Surface Science