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EPEPS 2008
Conference paper

Impedance design for multi-layered vias

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Abstract

This paper presents a methodology based on a semi-analytical scattering model to pre-design the characteristic impedance of multi-layered through hole vias by choosing appropriate via geometrical parameters, dielectric property, and the placement of ground vias. A linear model as a function of design parameters above is further applied to analyze the statistical variation of impedance for different tolerance specification. © 2008 IEEE.

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Publication

EPEPS 2008

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