PublicationIEEE Transactions on Electron DevicesPaperIIA-7 Monte Carlo Simulations of p-and n-Channel Dual-Gate Si MOSFET's at the Limits of ScalingIEEE Transactions on Electron DevicesView publicationAbstractNo abstract available.Home↳ PublicationsDate01 Jan 1993PublicationIEEE Transactions on Electron DevicesAuthorsD.J. FrankS.E. LauxM.V. FischettiIBM-affiliated at time of publicationShare