IIA-7 Monte Carlo Simulations of p-and n-Channel Dual-Gate Si MOSFET's at the Limits of Scaling

D. Arnold, E. Cartier, et al.

SPIE Laser-Induced Damage in Optical Materials 1990

M.V. Fischetti, S.E. Laux, et al.

IEDM 2003

D.C. Cole, E.M. Buturla, et al.

Solid State Electronics

Yeqing Lu, Alan C. Seabaugh, et al.

DRC 2010