J.H. Kaufman, Owen R. Melroy, et al.
Synthetic Metals
The epitaxial growth of Fe on Rh{001} at room temperature is studied by means of quantitative low-energy electron diffraction and Auger electron spectroscopy. The Fe films are pseudomorphic to the substrate and grow in the layer-by-layer mode for at least three layers no attempts were made to determine the growth mode above this thickness. The spacing between Fe and Rh at the substrate-film interface remains approximately the same (about 1.75), within experimental error, when the Fe films grow from one to two and three layers. The Fe-Fe interlayer spacing in the bilayer films is also about the same (1.73), but in the three-layer film the first two interlayer spacings collapse to about 1.65. Thicker (eight- to ten-layer) Fe films have bulk spacings of 1.56 and a 5.8%-expanded surface interlayer spacing (1.65). These films have a compressive strain in the film plane (the misfit to Rh{001} is -6.3%) and have a body-centered-tetragonal structure. Elastic strain analysis shows that the equilibrium (i.e., the unstrained) phase is bcc Fe; the bulk interlayer spacing in the films is expanded by 8.7% over the equilibrium value of bcc Fe (1.43) as a consequence of the epitaxial strain in the plane of the layers, and the atomic volume is reduced by 4.5%. © 1993 The American Physical Society.
J.H. Kaufman, Owen R. Melroy, et al.
Synthetic Metals
Zelek S. Herman, Robert F. Kirchner, et al.
Inorganic Chemistry
Xikun Hu, Wenlin Liu, et al.
IEEE J-STARS
T.N. Morgan
Semiconductor Science and Technology