J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering
We examine the effect of Co-cluster morphology on giant magnetoresistance (MR) in phase-separated Co-Cu films. The Co clusters were characterized through grazing incidence, anomalous, small-angle x-ray scattering. With thermal annealing the Co cluster diameter increases from 21 to ∼250 with a concomitant drop from ∼35% to 1% in the 4.2 K MR. The MR scales approximately as the inverse cluster size. Comparison with theory indicates that interfacial spin-dependent electron scattering is the dominant scattering mechanism underlying giant MR for cluster diameters up to at least 250. © 1993 The American Physical Society.
J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering
Imran Nasim, Melanie Weber
SCML 2024
R. Ghez, M.B. Small
JES
A. Nagarajan, S. Mukherjee, et al.
Journal of Applied Mechanics, Transactions ASME